CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing

Reducing excessive launch switching activity (LSA) is now mandatory in at-speed scan testing for avoiding test-induced yield loss, and test set modification is preferable for this purpose. However, previous low-LSA test set modification methods may be ineffective since they are not targeted at reducing launch switching activity in the areas around long sensitized paths, which are spatially and temporally critical for test-induced yield loss. This paper proposes a novel CAT (Critical-Area-Targeted) low-LSA test modification scheme, which uses long sensitized paths to guide launch-safety checking, test relaxation, and X-filling. As a result, launch switching activity is reduced in a pinpoint manner, which is more effective for avoiding test-induced yield loss. Experimental results on industrial circuits demonstrate the advantage of the CAT scheme for reducing launch switching activity in at-speed scan testing.2009 Asian Test Symposium, 23-26 November 2009, Taichung, Taiwa

Efficient Test Set Modification for Capture Power Reduction

The occurrence of high switching activity when the response to a test vector is captured by flipflops in scan testing may cause excessive IR drop, resulting in significant test-induced yield loss. This paper addresses the problem with a novel method based on test set modification, featuring (1) a new constrained X-identification technique that turns a properly selected set of bits in a fullyspecified test set into X-bits without fault coverage loss, and (2) a new LCP (low capture power) X-filling technique that optimally assigns 0’s and 1’s to the X-bits for the purpose of reducing the switching activity of the resulting test set in capture mode. This method can be readily applied in any test generation flow for capture power reduction without any impact on area, timing, test set size, and fault coverage

CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing

At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs inactive as possible by disabling corresponding clock-control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to make as many remaining active FFs as possible to have equal input and output values in Stage-2 (FF-Silencing). CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.2008 17th Asian Test Symposium (ATS 2008), 24-27 November 2008, Sapporo, Japa

Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling

It has become necessary to reduce power during LSI testing. Particularly, during at-speed testing, excessive power consumed during the Launch-To-Capture (LTC) cycle causes serious issues that may lead to the overkill of defect-free logic ICs. Many successful test generation approaches to reduce IR-drop and/or power supply noise during LTC for the launch-off capture (LOC) scheme have previously been proposed, and several of X-filling techniques have proven especially effective. With X-filling in the launch-off shift (LOS) scheme, however, adjacent-fill (which was originally proposed for shift-in power reduction) is used frequently. In this work, we propose a novel X-filling technique for the LOS scheme, called Adjacent-Probability-based X-Filling (AP-fill), which can reduce more LTC power than adjacent-fill. We incorporate AP-fill into a post-ATPG test modification flow consisting of test relaxation and X-filling in order to avoid the fault coverage loss and the test vector count inflation. Experimental results for larger ITC\u2799 circuits show that the proposed AP-fill technique can achieve a higher power reduction ratio than 0-fill, 1-fill, and adjacent-fill.2011 Asian Test Symposium, 20-23 November 2011, New Delhi, Indi

Study on ^<24>Mg (e, e\u27 α) Reaction(I. Nuclear Physics)

The angular correlation of ^Mg(e, e \u27α) reaction was measured for a momentum transfer of 0.51fm^ and energy transfers of 15.5-24.5 MeV. Emitted particles were detected with nine △E-E telescopes located out of plane, rotated around the q axis by 90°. As about a half of approved machine time has been carried, we briefly report a current status of analysis

Study of (e, e\u27 α) Reaction on ^9Be(I. Nuclear Physics)

The (e, e\u27 a) cross section has been measured at energy transfers from 10.0 to 28.4 MeV and a momentum transfer of 99 MeV/c, using a 197 MeV continuous electron beam. The cross section rapidly increases with decreasing energy at angles smaller than 25°, while it appears flat at larger angles. The forward-peaked angular distribution was observed below 18 MeV, and the forward peak shrinks at higher energies. An amount of αparticles from decay of ^5He is estimated

Photo-production of neutral kaons on 12C in the threshold region

Kaon photo-production process on $^{12}$C has been studied by measuring neutral kaons in a photon energy range of 0.8$-$1.1 GeV. Neutral kaons were identified by the invariant mass constructed from two charged pions emitted in the $K^{0}_{S}\to\pi^{+}\pi^{-}$ decay channel. The differential cross sections as well as the integrated ones in the threshold photon energy region were obtained. The obtained momentum spectra were compared with a Spectator model calculation using elementary amplitudes of kaon photo-production given by recent isobar models. Present result provides, for the first time, the information on $n(\gamma,K^{0})\Lambda$ reaction which is expected to play an important role to construct models for strangeness production by the electromagnetic interaction. Experimental results show that cross section of $^{12}{\rm C}(\gamma,K^0)$ is of the same order to that of $^{12}{\rm C}(\gamma,K^+)$ and suggest that slightly backward $K^0$ angular distribution is favored in the $\gamma n\to K^0\Lambda$ process.Comment: 6 pages, 8 figure

Characteristics of a High-Purity Germanium Detector

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